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The answer is True<\/strong>.<\/p>\n Latch-up is a condition that can occur in some semiconductor devices, such as integrated circuits, when there is a sudden transient in power. This can cause the device to become unstable and can lead to permanent damage.<\/p>\n Latch-up is caused by the interaction of two effects: the injection of minority carriers into the substrate of the device, and the formation of parasitic bipolar transistors. When a sudden transient in power occurs, it can cause a large number of minority carriers to be injected into the substrate. These minority carriers can then combine with majority carriers to form parasitic bipolar transistors. These transistors can then amplify the current flowing through the device, which can lead to latch-up.<\/p>\n Latch-up can be prevented by designing devices with features that suppress the injection of minority carriers and the formation of parasitic bipolar transistors. These features can include guard rings, isolation regions, and substrate biasing.<\/p>\n Latch-up can also be prevented by using devices that are designed to be immune to latch-up. These devices are typically made with special materials and structures that make them less susceptible to latch-up.<\/p>\n If latch-up does occur, it can be difficult to recover from. The device may need to be replaced or repaired.<\/p>\n","protected":false},"excerpt":{"rendered":" [amp_mcq option1=”TRUE” option2=”nan” option3=”nan” option4=”nan” correct=”option1″]<\/p>\n","protected":false},"author":1,"featured_media":0,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[687],"tags":[],"class_list":["post-19807","post","type-post","status-publish","format-standard","hentry","category-vlsi-design-and-testing","no-featured-image-padding"],"yoast_head":"\n