{"id":19738,"date":"2024-04-15T05:43:27","date_gmt":"2024-04-15T05:43:27","guid":{"rendered":"https:\/\/exam.pscnotes.com\/mcq\/?p=19738"},"modified":"2024-04-15T05:43:27","modified_gmt":"2024-04-15T05:43:27","slug":"latch-up-is-the-generation-of-a-low-impedance-path-b-high-impedance-path-c-low-resistance-path-d-high-resistance-path","status":"publish","type":"post","link":"https:\/\/exam.pscnotes.com\/mcq\/latch-up-is-the-generation-of-a-low-impedance-path-b-high-impedance-path-c-low-resistance-path-d-high-resistance-path\/","title":{"rendered":"Latch-up is the generation of . . . . . . . . A. Low impedance path B. High impedance path C. Low resistance path D. High resistance path"},"content":{"rendered":"<p>[amp_mcq option1=&#8221;Low impedance path&#8221; option2=&#8221;High impedance path&#8221; option3=&#8221;Low resistance path&#8221; option4=&#8221;High resistance path&#8221; correct=&#8221;option1&#8243;]<!--more--><\/p>\n<p>The correct answer is: <strong>A. Low impedance path<\/strong><\/p>\n<p>Latch-up is a condition in which a semiconductor device can become unstable and continue to conduct current even when the input signals are removed. This can cause the device to overheat and damage itself. Latch-up is caused by a positive feedback loop between the device&#8217;s input and output terminals. This loop can be created by a number of factors, including high current levels, high voltage levels, and improper device design.<\/p>\n<p>To prevent latch-up, semiconductor devices are typically designed with features that break the positive feedback loop. These features can include resistors, diodes, and capacitors. Latch-up can also be prevented by using proper operating conditions and by avoiding the use of devices that are known to be susceptible to latch-up.<\/p>\n<p>A low impedance path is a path that allows current to flow easily. This is the opposite of a high impedance path, which is a path that resists the flow of current. In the context of latch-up, a low impedance path can allow current to flow from the device&#8217;s input to its output, even when the input signals are removed. This can cause the device to overheat and damage itself.<\/p>\n<p>B, C, and D are incorrect because they do not describe the path that current takes during latch-up.<\/p>\n","protected":false},"excerpt":{"rendered":"<p>[amp_mcq option1=&#8221;Low impedance path&#8221; option2=&#8221;High impedance path&#8221; option3=&#8221;Low resistance path&#8221; option4=&#8221;High resistance path&#8221; correct=&#8221;option1&#8243;]<\/p>\n","protected":false},"author":1,"featured_media":0,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[687],"tags":[],"class_list":["post-19738","post","type-post","status-publish","format-standard","hentry","category-vlsi-design-and-testing","no-featured-image-padding"],"yoast_head":"<!-- This site is optimized with the Yoast SEO Premium plugin v22.2 (Yoast SEO v23.3) - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<title>Latch-up is the generation of . . . . . . . . A. 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