Latch-up is brought about by BJTs . . . . . . . . A. With positive feedback B. With negative feedback C. With no feedback D. Without BJT

With positive feedback
With negative feedback
With no feedback
Without BJT

The correct answer is: A. With positive feedback.

Latch-up is a destructive parasitic phenomenon that can occur in some integrated circuits (ICs) that contain complementary metal–oxide–semiconductor (CMOS) transistors. It is caused by a positive feedback loop that can occur when two or more CMOS transistors are connected in a particular way. This can lead to a sudden and uncontrolled increase in current, which can damage the IC.

Positive feedback is a type of feedback in which the output of a system is fed back into the input in such a way that it amplifies the output. This can lead to a runaway situation in which the output of the system increases without limit.

Negative feedback is a type of feedback in which the output of a system is fed back into the input in such a way that it counteracts the output. This can help to stabilize the system and prevent it from oscillating.

No feedback is a type of feedback in which the output of a system is not fed back into the input. This can lead to instability in the system, as there is nothing to counteract the output.

Without BJT is not a valid option, as latch-up can only occur in ICs that contain CMOS transistors.

I hope this explanation is helpful. Please let me know if you have any further questions.

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